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SN74ABT8543DWRG4

SN74ABT8543DWRG4
Mfr. #:
SN74ABT8543DWRG4
Beschreibung:
IC SCAN TEST DEVICE 28SOIC
Lebenszyklus:
Neu von diesem Hersteller.
Datenblatt:
SN74ABT8543DWRG4 Datenblatt
Die Zustellung:
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SN74ABT8543DWRG4 Mehr Informationen SN74ABT8543DWRG4 Product Details
Produkteigenschaft
Attributwert
Tags
SN74ABT8543DWR, SN74ABT8543DW, SN74ABT854, SN74ABT85, SN74ABT8, SN74AB, SN74A, SN74, SN7
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Step1: Vacuum Packaging with PL
Step1:
Vacuum Packaging with PL
Step2: Anti-Static Bag
Step2:
Anti-Static Bag
Step3: Packaging Boxes
Step3:
Packaging Boxes
***i-Key
IC SCAN TEST DEVICE 28SOIC
***as Instruments
The 'ABT8543 scan test devices with octal registered bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. In the normal mode, these devices are functionally equivalent to the 'F543 and 'ABT543 octal registered bus transceivers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self-test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal registered bus transceivers. Data flow in each direction is controlled by latch-enable ( and ), chip-enable ( and ), and output-enable ( and ) inputs. For A-to-B data flow, the device operates in the transparent mode when and are both low. When either or is high, the A data is latched. The B outputs are active when and are both low. When either or is high, the B outputs are in the high-impedance state. Control for B-to-A data flow is similar to that for A-to-B, but uses , , and . In the test mode, the normal operation of the SCOPETM registered bus transceiver is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations as described in IEEE Standard 1149.1-1990. Four dedicated test pins control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface. The SN54ABT8543 is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ABT8543 is characterized for operation from -40°C to 85°C.
Teil # Beschreibung Aktie Preis
SN74ABT8543DWRG4
DISTI # SN74ABT8543DWRG4-ND		IC SCAN TEST DEVICE 28SOIC
RoHS: Compliant
Min Qty: 1000
Container: Tape & Reel (TR)		Limited Supply - Call
    SN74ABT8543DWRG4
    DISTI # 595-SN74ABT8543DWRG4    		Specialty Function Logic Scan Test Devices
    RoHS: Compliant    		0
      Bild Teil # Beschreibung
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      Verfügbarkeit
      Aktie:
      Available
      Auf Bestellung:
      2000
      Menge eingeben:
      Der aktuelle Preis von SN74ABT8543DWRG4 dient nur als Referenz. Wenn Sie den besten Preis erhalten möchten, senden Sie bitte eine Anfrage oder senden Sie eine direkte E-Mail an unser Verkaufsteam [email protected]
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      Aufgrund von Halbleiterknappheit ab 2021 ist der untere Preis der Normalpreis vor 2021. Bitte senden Sie eine Anfrage zur Bestätigung.
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