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SN74LVTH182502APMR

SN74LVTH182502APMR
Mfr. #:
SN74LVTH182502APMR
Beschreibung:
Specialty Function Logic 3.3-V ABT w/18-Bit Univ Bus Transceiver
Lebenszyklus:
Neu von diesem Hersteller.
Datenblatt:
SN74LVTH182502APMR Datenblatt
Die Zustellung:
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ECAD Model:
Mehr Informationen:
SN74LVTH182502APMR Mehr Informationen SN74LVTH182502APMR Product Details
Produkteigenschaft
Attributwert
Hersteller:
Texas Instruments
Produktkategorie:
Spezialfunktionslogik
RoHS:
Y
Serie:
SN74LVTH182502A
Betriebsversorgungsspannung:
3.3 V
Minimale Betriebstemperatur:
- 40 C
Maximale Betriebstemperatur:
+ 85 C
Paket / Koffer:
LQFP-64
Verpackung:
Spule
Funktion:
Testgerät mit Universal Bus Transceiver scannen
Anzahl Kreise:
2
Betriebstemperaturbereich:
- 40 C to + 85 C
Marke:
Texas Instruments
Montageart:
SMD/SMT
Feuchtigkeitsempfindlich:
ja
Produktart:
Spezialfunktionslogik
Ausbreitungsverzögerungszeit:
7.7 ns
Werkspackungsmenge:
1000
Unterkategorie:
Logik-ICs
Handelsname:
UMFANG
Gewichtseinheit:
0.012088 oz
Tags
SN74LVTH18250, SN74LVTH1825, SN74LVTH182, SN74LVTH18, SN74LVTH1, SN74LVTH, SN74LVT, SN74LV, SN74L, SN74, SN7
Service Guarantees

We guarantee 100% customer satisfaction.

Quality Guarantees

We provide 90-360 days warranty.

If the items you received were not in perfect quality, we would be responsible for your refund or replacement, but the items must be returned in their original condition.
Our experienced sales team and tech support team back our services to satisfy all our customers.

we buy and manage excess electronic components, including excess inventory identified for disposal.
Email us if you have excess stock to sell.

Email: [email protected]

Step1: Vacuum Packaging with PL
Step1:
Vacuum Packaging with PL
Step2: Anti-Static Bag
Step2:
Anti-Static Bag
Step3: Packaging Boxes
Step3:
Packaging Boxes
    G***v
    G***v
    BG

    Ok :)

    2019-06-17
    G***y
    G***y
    RU

    4 pancake months waited, so nothing and came, money returned

    2019-05-28
*** Stop Electro
Boundary Scan Reg Bus Transceiver, LVT Series, 2-Func, 9-Bit, True Output, BICMOS, PQFP64
***as Instruments
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers 64-LQFP -40 to 85
***ark
Specialty Logic IC; Logic Family:LVT; Supply Voltage Min:2.7V; Supply Voltage Max:3.6V; Package/Case:64-LQFP; No. of Pins:64; Operating Temperature Range:-40°C to +85°C; Input Type:TTL/CMOS; Leaded Process Compatible:Yes ;RoHS Compliant: Yes
***AS INSTRUMENTS INCORPORATED
The ’LVTH18502A and ’LVTH182502A scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
***TEXAS
Additionally, these devices are designed specifically for low-voltage (3.3-V) VCC operation, but with the capability to provide a TTL interface to a 5-V system environment.
***NS
In the normal mode, these devices are 18-bit universal bus transceivers, that combine with D-type latches and D-type flip-flops, they allow data to flow in the transparent, latched, or clocked modes. Another use is as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPE universal bus transceivers.
***AS INTRUMENTS
Data flow in each direction is controlled by output-enable (OEAB\ and OEBA\), latch-enable (LEAB and LEBA), and clock (CLKAB and CLKBA) inputs. For A-to-B data flow, the device operates in the transparent mode when LEAB is high. When LEAB is low, the A-bus data is latched while CLKAB is held at a static low or high logic level. Otherwise, if LEAB is low, A-bus data is stored on a low-to-high transition of CLKAB. When OEAB\ is low, the B outputs are active. When OEAB\ is high, the B outputs are in the high-impedance state. B-to-A data flow is similar to A-to-B data flow, but uses the OEBA\, LEBA, and CLKBA inputs.
***AS INSTRUM
In the test mode, the normal operation of the SCOPE universal bus transceivers is inhibited, and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990.
***AS INSTRUMENTS INCORPORATED
Four dedicated test pins are used to observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudorandom pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
***AS INSTUMENTS
Active bus-hold circuitry is provided to hold unused or floating data inputs at a valid logic level.
***AS INS
The B-port outputs of ’LVTH182502A, which are designed to source or sink up to 12 mA, include 25- series resistors to reduce overshoot and undershoot.
***AS INSTRUMENTS INCORPORATED
The SN54LVTH18502A and SN54LVTH182502A are characterized for operation over the full military temperature range of –55°C to 125°C. The SN74LVTH18502A and SN74LVTH182502A are characterized for operation from –40°C to 85°C.
Logic Solutions
OMO Electronic Logic Solutions offers a full spectrum of logic functions and technologies from the mature to the advanced, including bipolar, BiCMOS, and CMOS. TI's process technologies offer the logic performance and features required for modern logic designs, while maintaining support for more traditional logic products.Learn More
Teil # Beschreibung Aktie Preis
SN74LVTH182502APMR
DISTI # 296-29777-1-ND		IC SCAN-TEST-DEV/TRANSCVR 64LQFP
RoHS: Compliant
Min Qty: 1
Container: Cut Tape (CT)		406In Stock
  • 500:$6.0332
  • 100:$6.9284
  • 10:$8.3690
  • 1:$9.2600
SN74LVTH182502APMR
DISTI # 296-29777-6-ND		IC SCAN-TEST-DEV/TRANSCVR 64LQFP
RoHS: Compliant
Min Qty: 1
Container: Digi-Reel®		406In Stock
  • 500:$6.0332
  • 100:$6.9284
  • 10:$8.3690
  • 1:$9.2600
SN74LVTH182502APMR
DISTI # 296-29777-2-ND		IC SCAN-TEST-DEV/TRANSCVR 64LQFP
RoHS: Compliant
Min Qty: 1000
Container: Tape & Reel (TR)		Temporarily Out of Stock
  • 2000:$4.9127
  • 1000:$5.1017
SN74LVTH182502APMR
DISTI # SN74LVTH182502APMR		Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP T/R - Tape and Reel (Alt: SN74LVTH182502APMR)
RoHS: Compliant
Min Qty: 1000
Container: Reel		Americas - 0
  • 1000:$5.3900
  • 2000:$5.1900
  • 4000:$4.9900
  • 6000:$4.7900
  • 10000:$4.6900
SN74LVTH182502APMR
DISTI # SN74LVTH182502APMR		Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP T/R (Alt: SN74LVTH182502APMR)
RoHS: Compliant
Min Qty: 1000
Container: Tape and Reel		Europe - 0
  • 1000:€6.2900
  • 2000:€5.5900
  • 4000:€4.9900
  • 6000:€4.6900
  • 10000:€4.4900
SN74LVTH182502APMRBoundary Scan Reg Bus Transceiver, LVT Series, 2-Func, 9-Bit, True Output, BICMOS, PQFP64
RoHS: Compliant		4500
  • 1000:$4.9700
  • 500:$5.2400
  • 100:$5.4500
  • 25:$5.6800
  • 1:$6.1200
SN74LVTH182502APM
DISTI # 595-SN74LVTH182502PM		Specialty Function Logic 10-Bit Buffer/Driver With 3-State Outputs
RoHS: Compliant		0
  • 160:$8.0800
  • 320:$7.6700
  • 640:$7.0300
  • 1120:$6.1300
SN74LVTH182502APMR
DISTI # 595-SN74LVTH182502AP		Specialty Function Logic 3.3-V ABT w/18-Bit Univ Bus Transceiver
RoHS: Compliant		0
  • 1000:$5.1100
Bild Teil # Beschreibung
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SN74LVTH16240DGG

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SN74LVTH16373DGGR(PB FRE

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 Neu und Original
Verfügbarkeit
Aktie:
Available
Auf Bestellung:
4000
Menge eingeben:
Der aktuelle Preis von SN74LVTH182502APMR dient nur als Referenz. Wenn Sie den besten Preis erhalten möchten, senden Sie bitte eine Anfrage oder senden Sie eine direkte E-Mail an unser Verkaufsteam [email protected]
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