SN74BCT8244ANTG4

SN74BCT8244ANTG4
Mfr. #:
SN74BCT8244ANTG4
Beschreibung:
IC SCAN TEST DEVICE BUFF 24-DIP
Lebenszyklus:
Neu von diesem Hersteller.
Datenblatt:
SN74BCT8244ANTG4 Datenblatt
Die Zustellung:
DHL FedEx Ups TNT EMS
Zahlung:
T/T Paypal Visa MoneyGram Western Union
ECAD Model:
Mehr Informationen:
SN74BCT8244ANTG4 Mehr Informationen SN74BCT8244ANTG4 Product Details
Produkteigenschaft
Attributwert
Tags
SN74BCT8244AN, SN74BCT8244, SN74BCT82, SN74BCT8, SN74B, SN74, SN7
Service Guarantees

We guarantee 100% customer satisfaction.

Quality Guarantees

We provide 90-360 days warranty.

If the items you received were not in perfect quality, we would be responsible for your refund or replacement, but the items must be returned in their original condition.
Our experienced sales team and tech support team back our services to satisfy all our customers.

we buy and manage excess electronic components, including excess inventory identified for disposal.
Email us if you have excess stock to sell.

Email: [email protected]

Step1: Vacuum Packaging with PL
Step1:
Vacuum Packaging with PL
Step2: Anti-Static Bag
Step2:
Anti-Static Bag
Step3: Packaging Boxes
Step3:
Packaging Boxes
Teil # Beschreibung Aktie Preis
SN74BCT8244ANTG4
DISTI # SN74BCT8244ANTG4-ND
IC SCAN TEST DEVICE BUFF 24-DIP
RoHS: Compliant
Min Qty: 60
Container: Tube
Limited Supply - Call
    Bild Teil # Beschreibung
    SN74BCT8374ADW

    Mfr.#: SN74BCT8374ADW

    OMO.#: OMO-SN74BCT8374ADW

    Specialty Function Logic Device w/Octal D-Typ Edge-Trig Flip-Flop
    SN74BCT8373ADWRG4

    Mfr.#: SN74BCT8373ADWRG4

    OMO.#: OMO-SN74BCT8373ADWRG4

    Specialty Function Logic IEEE Std 1149.1 Bndry Scan Tst Devic
    SN74BCT8374ADWRE4

    Mfr.#: SN74BCT8374ADWRE4

    OMO.#: OMO-SN74BCT8374ADWRE4

    Specialty Function Logic Fixed LDO Volt Reg
    SN74BCT8244ADWR

    Mfr.#: SN74BCT8244ADWR

    OMO.#: OMO-SN74BCT8244ADWR-TEXAS-INSTRUMENTS

    IC SCAN TEST DEVICE BUFF 24-SOIC
    SN74BCT8240ADWR

    Mfr.#: SN74BCT8240ADWR

    OMO.#: OMO-SN74BCT8240ADWR-TEXAS-INSTRUMENTS

    IC SCAN TEST DEVICE BUFF 24-SOIC
    SN74BCT8240ADWRG4

    Mfr.#: SN74BCT8240ADWRG4

    OMO.#: OMO-SN74BCT8240ADWRG4-TEXAS-INSTRUMENTS

    IC SCAN TEST DEVICE 24SOIC
    SN74BCT8240ANT

    Mfr.#: SN74BCT8240ANT

    OMO.#: OMO-SN74BCT8240ANT-TEXAS-INSTRUMENTS

    IC SCAN TEST DEVICE BUFF 24-DIP
    SN74BCT8240ANTG4

    Mfr.#: SN74BCT8240ANTG4

    OMO.#: OMO-SN74BCT8240ANTG4-TEXAS-INSTRUMENTS

    IC SCAN TEST DEVICE BUFF 24-DIP
    SN74BCT8244ANTG4

    Mfr.#: SN74BCT8244ANTG4

    OMO.#: OMO-SN74BCT8244ANTG4-TEXAS-INSTRUMENTS

    IC SCAN TEST DEVICE BUFF 24-DIP
    SN74BCT8373DWR

    Mfr.#: SN74BCT8373DWR

    OMO.#: OMO-SN74BCT8373DWR-1190

    Boundary Scan Bus Driver, BCT/FBT Series, 1-Func, 8-Bit, True Output, BICMOS, PDSO24
    Verfügbarkeit
    Aktie:
    Available
    Auf Bestellung:
    2000
    Menge eingeben:
    Der aktuelle Preis von SN74BCT8244ANTG4 dient nur als Referenz. Wenn Sie den besten Preis erhalten möchten, senden Sie bitte eine Anfrage oder senden Sie eine direkte E-Mail an unser Verkaufsteam [email protected]
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