SN74ABTH182502APM

SN74ABTH182502APM
Mfr. #:
SN74ABTH182502APM
Beschreibung:
Specialty Function Logic Device w/18-Bit Univ Bus Transceiver
Lebenszyklus:
Neu von diesem Hersteller.
Datenblatt:
SN74ABTH182502APM Datenblatt
Die Zustellung:
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ECAD Model:
Mehr Informationen:
SN74ABTH182502APM Mehr Informationen SN74ABTH182502APM Product Details
Produkteigenschaft
Attributwert
Hersteller:
Texas Instruments
Produktkategorie:
Spezialfunktionslogik
RoHS:
Y
Serie:
SN74ABTH182502A
Betriebsversorgungsspannung:
5 V
Minimale Betriebstemperatur:
- 40 C
Maximale Betriebstemperatur:
+ 85 C
Paket / Koffer:
LQFP-64
Verpackung:
Tablett
Funktion:
Testgerät mit Universal Bus Transceiver scannen
Anzahl Kreise:
2
Betriebstemperaturbereich:
- 40 C to + 85 C
Marke:
Texas Instruments
Montageart:
SMD/SMT
Feuchtigkeitsempfindlich:
ja
Produktart:
Spezialfunktionslogik
Ausbreitungsverzögerungszeit:
5.8 ns
Werkspackungsmenge:
160
Unterkategorie:
Logik-ICs
Handelsname:
UMFANG
Gewichtseinheit:
0.012088 oz
Tags
SN74ABTH1825, SN74ABTH182, SN74ABTH18, SN74ABTH1, SN74ABTH, SN74AB, SN74A, SN74, SN7
Service Guarantees

We guarantee 100% customer satisfaction.

Quality Guarantees

We provide 90-360 days warranty.

If the items you received were not in perfect quality, we would be responsible for your refund or replacement, but the items must be returned in their original condition.
Our experienced sales team and tech support team back our services to satisfy all our customers.

we buy and manage excess electronic components, including excess inventory identified for disposal.
Email us if you have excess stock to sell.

Email: [email protected]

Step1: Vacuum Packaging with PL
Step1:
Vacuum Packaging with PL
Step2: Anti-Static Bag
Step2:
Anti-Static Bag
Step3: Packaging Boxes
Step3:
Packaging Boxes
    E**h
    E**h
    RU

    Instead of 50 pcs received 49 pcs, as with many, it is the norm for the seller. The goods were only tracked by china.

    2019-07-01
    P***n
    P***n
    BA

    thank you

    2019-07-04
    V***o
    V***o
    KZ

    Tested. Ok. Thanks.

    2019-01-26
*** Stop Electro
Boundary Scan Reg Bus Transceiver, ABT Series, 2-Func, 9-Bit, True Output, BICMOS, PQFP64
***as Instruments
Scan Test Devices With 18-Bit Universal Bus Transceivers 64-LQFP -40 to 85
***inecomponents.com
Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray
***DA Technology Co., Ltd.
Product Description Demo for Development.
***i-Key Marketplace
SN74ABTH182502A SCAN TEST DEVICE
***AS INSRUMENTS
The 'ABTH18502A and 'ABTH182502A scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
***AS INSTRUMENTS INC
In the normal mode, these devices are 18-bit universal bus transceivers that combine D-type latches and D-type flip-flops to allow data flow in transparent, latched, or clocked modes. They can be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPE universal bus transceivers.
***AS INSTRUMEN
Data flow in each direction is controlled by output-enable ( and ), latch-enable (LEAB and LEBA), and clock (CLKAB and CLKBA) inputs. For A-to-B data flow, the device operates in the transparent mode when LEAB is high. When LEAB is low, the A-bus data is latched while CLKAB is held at a static low or high logic level. Otherwise, if LEAB is low, A-bus data is stored on a low-to-high transition of CLKAB. When is low, the B outputs are active. When is high, the B outputs are in the high-impedance state. B-to-A data flow is similar to A-to-B data flow but uses the , LEBA, and CLKBA inputs.
***AS INSTRUMENTS INCORPORATED
In the test mode, the normal operation of the SCOPE universal bus transceivers is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990.
***OMO Electronic
 
***AS INSRUMENT
Four dedicated test pins observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
***INS
Improved scan efficiency is accomplished through the adoption of a one boundary-scan cell (BSC) per I/O pin architecture. This architecture is implemented in such a way as to capture the most pertinent test data. A PSA/COUNT instruction also is included to ease the testing of memories and other circuits where a binary count addressing scheme is useful.
***AS INSTRUM
Active bus-hold circuitry holds unused or floating data inputs at a valid logic level.
***
The B-port outputs of 'ABTH182502A, which are designed to source or sink up to 12 mA, include 25- series resistors to reduce overshoot and undershoot.
***AS INST
The SN54ABTH18502A and SN54ABTH182502A are characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ABTH18502A and SN74ABTH182502A are characterized for operation from -40°C to 85°C.
***AS INST
 
***TEXAS
 
***AS INSTR
A-to-B data flow is shown. B-to-A data flow is similar but uses OEBA\, LEBA, and CLKBA.
***AS INSTRU
Output level before the indicated steady-state input conditions were established
Logic Solutions
OMO Electronic Logic Solutions offers a full spectrum of logic functions and technologies from the mature to the advanced, including bipolar, BiCMOS, and CMOS. TI's process technologies offer the logic performance and features required for modern logic designs, while maintaining support for more traditional logic products.Learn More
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SN74ABTH182502APM
DISTI # V39:1801_07325455
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DISTI # 296-4131-ND
IC SCAN TEST UNIV TXRX 64LQFP
RoHS: Compliant
Min Qty: 1
Container: Tray
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Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray
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Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray
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DISTI # SN74ABTH182502APM
Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray - Trays (Alt: SN74ABTH182502APM)
RoHS: Compliant
Min Qty: 1
Container: Tray
Americas - 0
  • 1:$19.5900
  • 10:$17.9900
  • 25:$17.2900
  • 50:$17.1900
  • 100:$15.4900
  • 500:$13.9900
  • 1000:$13.4900
SN74ABTH182502APMScan Test Devices With 18-Bit Universal Bus Transceivers4800
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  • 750:$10.9800
  • 500:$12.2300
  • 250:$13.2900
  • 100:$13.9600
  • 25:$15.9800
  • 10:$16.5600
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SN74ABTH182502APM
DISTI # 595-SN74ABTH182502AP
Specialty Function Logic Device w/18-Bit Univ Bus Transceiver
RoHS: Compliant
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RoHS: Compliant
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  • 1000:$12.6700
  • 500:$13.3400
  • 100:$13.8900
  • 25:$14.4800
  • 1:$15.6000
SN74ABTH182502APM
DISTI # C1S746201940892
Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray
RoHS: Compliant
2
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Verfügbarkeit
Aktie:
Available
Auf Bestellung:
4500
Menge eingeben:
Der aktuelle Preis von SN74ABTH182502APM dient nur als Referenz. Wenn Sie den besten Preis erhalten möchten, senden Sie bitte eine Anfrage oder senden Sie eine direkte E-Mail an unser Verkaufsteam [email protected]
Referenzpreis (USD)
Menge
Stückpreis
ext. Preis
160
15,70 $
2 512,00 $
320
14,93 $
4 777,60 $
640
13,97 $
8 940,80 $
Aufgrund von Halbleiterknappheit ab 2021 ist der untere Preis der Normalpreis vor 2021. Bitte senden Sie eine Anfrage zur Bestätigung.
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