OMO ElectronicOMO Electronic
Expand menu
Hallo, melde dich anMein Konto
0 Wagen

74ABTH18504APMRG4

74ABTH18504APMRG4
Mfr. #:
74ABTH18504APMRG4
Beschreibung:
IC SCAN TEST UNIV TXRX 64LQFP
Lebenszyklus:
Neu von diesem Hersteller.
Datenblatt:
74ABTH18504APMRG4 Datenblatt
Die Zustellung:
DHL FedEx Ups TNT EMS
Zahlung:
T/T Paypal Visa MoneyGram Western Union
ECAD Model:
Mehr Informationen:
74ABTH18504APMRG4 Mehr Informationen 74ABTH18504APMRG4 Product Details
Produkteigenschaft
Attributwert
Tags
74ABTH1, 74ABTH, 74ABT, 74AB, 74A
Service Guarantees

We guarantee 100% customer satisfaction.

Quality Guarantees

We provide 90-360 days warranty.

If the items you received were not in perfect quality, we would be responsible for your refund or replacement, but the items must be returned in their original condition.
Our experienced sales team and tech support team back our services to satisfy all our customers.

we buy and manage excess electronic components, including excess inventory identified for disposal.
Email us if you have excess stock to sell.

Email: [email protected]

Step1: Vacuum Packaging with PL
Step1:
Vacuum Packaging with PL
Step2: Anti-Static Bag
Step2:
Anti-Static Bag
Step3: Packaging Boxes
Step3:
Packaging Boxes
*** Stop Electro
Boundary Scan Reg Bus Transceiver, ABT Series, 1-Func, 20-Bit, True Output, BICMOS, PQFP64
***i-Key
IC SCAN TEST UNIV TXRX 64LQFP
***el Nordic
Contact for details
***as Instruments
The 'ABTH18504A and 'ABTH182504A scan test devices with 20-bit universal bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. In the normal mode, these devices are 20-bit universal bus transceivers that combine D-type latches and D-type flip-flops to allow data flow in transparent, latched, or clocked modes. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPETM universal bus transceivers. Data flow in each direction is controlled by output-enable ( and ), latch-enable (LEAB and LEBA), clock-enable ( and ), and clock (CLKAB and CLKBA) inputs. For A-to-B data flow, the device operates in the transparent mode when LEAB is high. When LEAB is low, the A-bus data is latched while is high and/or CLKAB is held at a static low or high logic level. Otherwise, if LEAB is low and is low, A-bus data is stored on a low-to-high transition of CLKAB. When is low, the B outputs are active. When is high, the B outputs are in the high-impedance state. B-to-A data flow is similar to A-to-B data flow, but uses the , LEBA, , and CLKBA inputs. In the test mode, the normal operation of the SCOPETM universal bus transceivers is inhibited, and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990. Four dedicated test pins observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface. Improved scan efficiency is accomplished through the adoption of a one boundary-scan cell (BSC) per I/O pin architecture. This architecture is implemented in such a way as to capture the most pertinent test data. A PSA/COUNT instruction also is included to ease the testing of memories and other circuits where a binary count addressing scheme is useful. Active bus-hold circuitry holds unused or floating data inputs at a valid logic level. The B-port outputs of 'ABTH182504A, which are designed to source or sink up to 12 mA, include 25- series resistors to reduce overshoot and undershoot. The SN54ABTH18504A and SN54ABTH182504A are characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ABTH18504A and SN74ABTH182504A are characterized for operation from -40°C to 85°C. A-to-B data flow is shown. B-to-A data flow is similar but uses OEBA\, LEBA, CLKENBA\, and CLKBA. Output level before the indicated steady-state input conditions were established
Teil # Beschreibung Aktie Preis
74ABTH18504APMRG4
DISTI # 74ABTH18504APMRG4-ND		IC SCAN TEST UNIV TXRX 64LQFP
RoHS: Compliant
Min Qty: 1000
Container: Tape & Reel (TR)		Limited Supply - Call
    74ABTH18504APMRG4
    DISTI # 595-ABTH18504APMRG4    		Specialty Function Logic Scan Test Devices
    RoHS: Compliant    		0
      Bild Teil # Beschreibung
      74ABTH18504APMRG4

      Mfr.#: 74ABTH18504APMRG4

      OMO.#: OMO-74ABTH18504APMRG4-TEXAS-INSTRUMENTS

      		 IC SCAN TEST UNIV TXRX 64LQFP
      74ABTH18502A

      Mfr.#: 74ABTH18502A

      OMO.#: OMO-74ABTH18502A-1190

      		 Neu und Original
      Verfügbarkeit
      Aktie:
      Available
      Auf Bestellung:
      1500
      Menge eingeben:
      Der aktuelle Preis von 74ABTH18504APMRG4 dient nur als Referenz. Wenn Sie den besten Preis erhalten möchten, senden Sie bitte eine Anfrage oder senden Sie eine direkte E-Mail an unser Verkaufsteam [email protected]
      Referenzpreis (USD)
      Menge
      Stückpreis
      ext. Preis
      1
      0,00 $
      0,00 $
      10
      0,00 $
      0,00 $
      100
      0,00 $
      0,00 $
      500
      0,00 $
      0,00 $
      1000
      0,00 $
      0,00 $
      Aufgrund von Halbleiterknappheit ab 2021 ist der untere Preis der Normalpreis vor 2021. Bitte senden Sie eine Anfrage zur Bestätigung.
      Beginnen mit
      Neueste Produkte
      More Newest Products
      Top